Aspheric lenses and surfaces are increasingly used in modern high-quality optics. Therefore, new measuring methods for an accurate
quantification of these aspheres are also necessary. The current approach to quantify aspheres is to apply null systems such as
computer-generated holograms as a part of a null lens in a interferometer. An alternative to this method is the Shack–Hartmann wavefront
sensor. The dynamic range of this sensor can be adjusted by the optical parameters of the applied microlens array. Hence, large wavefront
aberrations can be measured directly without a null lens. However, there are basic limitations in the dynamic range of a Shack–Hartmann
sensor (SHS) depending on the curvature of the incident wavefront. In this paper, an analytical expression to determine the strongest
wavefront curvature which can be measured with a de3ned microlens array of an SHS is derived. It allows to calculate the microlens
parameters required to measure the wavefront of a test lens. Particularly, the in8uence of rotational symmetric aspherical wavefront shapes
to the dynamic range of an SHS has been studied. A comparison between interferometry and the SHS has been accomplished. Numerical
solutions using scalar di:raction theory illustrate the analytical predictions.
